Products

All our products allow in situ measurements of your sample.

Scanning Probe Microscopy

X-Ray & Optical techniques

Gas Supply & Analysis

Support Equipment

Custom projects

Scanning Probe Microscopy

In the last decades, LPM has acquired a lot of experience in designing SPM’s that are compatible with various external stimuli, allowing you to measure samples at extreme temperature, pressures or during chemical reactions, during growth, in UHV, liquid etc.

X-Ray & Optical techniques

X-ray diffraction and optical techniques are a valuable non-destructive tool for material characterization. LPM has developed multiple products amongst which are combinations of this technique with SPM or CVD under various conditions for in situ material analysis. User results have been communicated in highly ranked journals.

Gas Supply & Analysis

For defining the near-ambient or high pressure conditions during surface science experiments, an extreme clean gas supply system is required. For relating the imaging, diffraction or spectroscopy results to chemical activity, an accurate gas analysis method is required that can handle a broad range of inlet pressures, without compromising the time resolution. We have developed a complete solution that is flexible to be tuned to a variety of applications.

Support Equipment

Next to the complete systems, we also support scientists who build their own equipment with some high-end components we developed such as a low noise high bandwidth IV converter, fast and powerful piezo drivers, components for gas supply and gas analysis, etc.

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Custom Projects

All of our products originated as custom designs: that is our core business. In close collaboration with our customers we design, assemble and install high-tech instrumentation for in situ surface science. We have experience in SPM, X-Ray and optical techniques in extreme environments (i.e. extreme pressures, temperatures and subject to catalytic reactions). 

Download the catalogue

For more information on our in situ products, solutions  and specifications. 

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